Andrei-Timotei Ardelean, Tim Weyrich
Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU)
In this work, we propose a system that covers the complete workflow for achieving controlled authoring and editing of textures that present distinctive local characteristics. These include various effects that change the surface appearance of materials, such as stains, tears, holes, abrasions, discoloration, and more. Such alterations are ubiquitous in nature, and including them in the synthesis process is crucial for generating realistic textures. We introduce a novel approach for creating textures with such blemishes, adopting a learning-based approach that leverages unlabeled examples. Our approach does not require manual annotations by the user; instead, it detects the appearance-altering features through unsupervised anomaly detection. The various textural features are then automatically clustered into semantically coherent groups, which are used to guide the conditional generation of images. Our pipeline as a whole goes from a small image collection to a versatile generative model that enables the user to interactively create and paint features on textures of arbitrary size. Notably, the algorithms we introduce for diffusion-based editing and infinite stationary texture generation are generic and should prove useful in other contexts as well.
Andrei-Timotei Ardelean, Tim Weyrich. ACM Transactions on Graphics (Proc. SIGGRAPH Asia), 10 pages, 2025.Andrei-Timotei Ardelean and Tim Weyrich. Example-based feature painting on textures. ACM Transactions on Graphics (Proc. SIGGRAPH Asia), December 2025.Ardelean, A.-T., and Weyrich, T. 2025. Example-based feature painting on textures. ACM Transactions on Graphics (Proc. SIGGRAPH Asia) (Dec.).A.-T. Ardelean and T. Weyrich, “Example-based feature painting on textures,”ACM Transactions on Graphics (Proc. SIGGRAPH Asia), Dec. 2025. |
Andrei-Timotei Ardelean, Patrick Rückbeil, Tim Weyrich. Vision, Modeling, and Visualization (VMV), September 29 – October 01, Erlangen, Germany, 2025.Andrei-Timotei Ardelean, Patrick Rückbeil, and Tim Weyrich. Quantized FCA: Efficient zero-shot texture anomaly detection. In 30th Intl. Conference on Vision, Modeling, and Visualization (VMV), September 2025.Ardelean, A.-T., Rückbeil, P., and Weyrich, T. 2025. Quantized FCA: Efficient zero-shot texture anomaly detection. In 30th Intl. Conference on Vision, Modeling, and Visualization (VMV).A.-T. Ardelean, P. Rückbeil, and T. Weyrich, “Quantized FCA: Efficient zero-shot texture anomaly detection,” in 30th Intl. Conference on Vision, Modeling, and Visualization (VMV), Sep. 2025. [Web Page][PDF (685 KB)][Suppl. Material (59 KB)][Live Video (31 MB)][BibTeX] | |
Andrei-Timotei Ardelean, Tim Weyrich. ACM SIGGRAPH Posters '24, July 27–August 01, Denver, CO, USA, 2024.Andrei-Timotei Ardelean and Tim Weyrich. Classifying texture anomalies at first sight. In ACM SIGGRAPH 2024 Posters, SIGGRAPH ’24, New York, NY, USA, July 2024. Association for Computing Machinery.Ardelean, A.-T., and Weyrich, T. 2024. Classifying texture anomalies at first sight. In ACM SIGGRAPH 2024 Posters, Association for Computing Machinery, New York, NY, USA, SIGGRAPH ’24.A.-T. Ardelean and T. Weyrich, “Classifying texture anomalies at first sight,” in ACM SIGGRAPH 2024 Posters, ser. SIGGRAPH ’24. New York, NY, USA: Association for Computing Machinery, Jul. 2024. [Online]. Available: https://doi.org/10.1145/3641234.3671071 [Web Page][PDF (3.0 MB)][Poster PDF (16 MB)][BibTeX] | |
Andrei-Timotei Ardelean, Tim Weyrich. Proc. IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) Workshops, 3900–3909, June 2024.Andrei-Timotei Ardelean and Tim Weyrich. Blind localization and clustering of anomalies in textures. In Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, pages 3900–3909, June 2024.Ardelean, A.-T., and Weyrich, T. 2024. Blind localization and clustering of anomalies in textures. In Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, 3900–3909.A.-T. Ardelean and T. Weyrich, “Blind localization and clustering of anomalies in textures,” in Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, Jun. 2024, pp. 3900–3909. [Web Page][PDF (6 MB)][Suppl. Material (461 KB)][Source Code][BibTeX][arXiv Version] | |
Andrei-Timotei Ardelean, Tim Weyrich. IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), 1134–1144, January 2024.Andrei-Timotei Ardelean and Tim Weyrich. High-fidelity zero-shot texture anomaly localization using feature correspondence analysis. In Proc. IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), January 2024.Ardelean, A.-T., and Weyrich, T. 2024. High-fidelity zero-shot texture anomaly localization using feature correspondence analysis. In Proc. IEEE/CVF Winter Conference on Applications of Computer Vision (WACV).A.-T. Ardelean and T. Weyrich, “High-fidelity zero-shot texture anomaly localization using feature correspondence analysis,” in Proc. IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), Jan. 2024. [Web Page][PDF (37 MB)][Low-res PDF (2.0 MB)][Suppl. Material, PDF only (1.4 MB)][Suppl. Material, Full Archive (90 MB)][Short Video (55 MB)][Source Code][BibTeX][arXiv Versions][Open-Access Version] |
This project has received funding from the European Union’s Horizon 2020 research and innovation program under the Marie Skłodowska-Curie grant agreement No 956585.