Tim Weyrich1, Pieter Peers2,3, Wojciech Matusik4, Szymon Rusinkiewicz5
1 University College London
2 University of Southern California
3 Institute for Creative Technologies
4 Adobe Systems, Inc.
5 Princeton University
We propose a system for manufacturing physical surfaces that, in aggregate, exhibit a desired surface appearance. Our system begins with a user specification of a BRDF, or simply a highlight shape, and infers the required distribution of surface slopes. We sample this distribution, optimize for a maximally-continuous and valley-minimizing height field, and finally mill the surface using a computer-controlled machine tool. We demonstrate a variety of surfaces, ranging from reproductions of measured BRDFs to materials with unconventional highlights.
Tim Weyrich, Pieter Peers, Wojciech Matusik, Szymon Rusinkiewicz. ACM Transactions on Graphics (Proc. SIGGRAPH), 28(3), 32:1–32:6, New Orleans, LA, 2009.Tim Weyrich, Pieter Peers, Wojciech Matusik, and Szymon Rusinkiewicz. Fabricating microgeometry for custom surface reflectance. ACM Trans. on Graphics (Proc. SIGGRAPH), 28(3):32:1–32:6, July 2009.Weyrich, T., Peers, P., Matusik, W., and Rusinkiewicz, S. 2009. Fabricating microgeometry for custom surface reflectance. ACM Trans. on Graphics (Proc. SIGGRAPH) 28, 3 (July), 32:1–32:6.T. Weyrich, P. Peers, W. Matusik, and S. Rusinkiewicz, “Fabricating microgeometry for custom surface reflectance,” ACM Trans. on Graphics (Proc. SIGGRAPH), vol. 28, no. 3, pp. 32:1–32:6, Jul. 2009. |
We thank Saskia Mordijck, Bruce Lamond, Monica Nichelson, Paul Debevec, Bill Swartout, Randy Hill, and Randolph Hall for their support with this work, which was partially funded by the US National Science Foundation, grants CCF-0347427 and CCF-0702580. P. Peers was supported by the U.S. Army Research, Development, and Engineering Command (RDECOM) and the Univ. of South. California Office of the Provost. The content of the information does not necessarily reflect the position or the policy of the US Government, and no official endorsement should be inferred.